Game-Changing Monitoring System for Nanoparticles and Impurities
As the quality demands for semiconductor materials continue to escalate, material inspection and
monitoring become all the more critical. The SuperSizer In-line Nanoparticle Monitoring System
successfully identifies nanoparticles and impurities of liquid chemicals that affect the production yield, helping processing engineers to "see" ultrafine particles in technology nodes below 20 nanometers (nm). The measurement process is completely undisturbed by nanobubbles and accurately measures the size and quantity distribution of particles as small as 3 nm, enabling users to control risks and get a full grasp on yield.

SEMICON West 2024 will be held from July 9-11 at the Moscone Center, San Francisco, CA. Make sure to drop by Chroma's Booth 5754 & 5756 in North Hall to experience the latest breakthroughs in test and measurement technology. We look forward to connecting with you.